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Stoichiometry optimization of homoepitaxial oxide thin films using x-ray diffraction

โœ Scribed by LeBeau, James M.; Engel-Herbert, Roman; Jalan, Bharat; Cagnon, Joel; Moetakef, Pouya; Stemmer, Susanne; Stephenson, G. Brian

Book ID
111898179
Publisher
American Institute of Physics
Year
2009
Tongue
English
Weight
633 KB
Volume
95
Category
Article
ISSN
0003-6951

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โœ Birkholz, Mario ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Wiley-VCH Verlag GmbH & Co. KGaA ๐ŸŒ German โš– 678 KB

Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr