𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Use of Michelson and Fabry–Perot interferometry for independent determination of the refractive index and physical thickness of wafers

✍ Scribed by Gillen, Glen D. ;Guha, Shekhar


Book ID
115351852
Publisher
The Optical Society
Year
2005
Tongue
English
Weight
66 KB
Volume
44
Category
Article
ISSN
1559-128X

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES