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Fizeau interferometry for measuring refractive index and thickness of nearly transparent films

โœ Scribed by Buckman, A. B. ;Kuo, C.

Book ID
115326424
Publisher
The Optical Society
Year
1978
Tongue
English
Weight
610 KB
Volume
17
Category
Article
ISSN
1559-128X

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Improved technique for measuring refract
Improved technique for measuring refractive index and thickness of a transparent plate
โœ Zhi-Cheng Jian; Cheng-Chih Hsu; Der-Chin Su ๐Ÿ“‚ Article ๐Ÿ“… 2003 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 97 KB

The phase difference between s-and p-polarizations of a circularly polarized heterodyne light beam reflected from a transparent plate is measured. The measured data is substituted into the specially derived equations and the refractive index can be calculated. Next, the variations of phase differenc