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Improved technique for measuring refractive index and thickness of a transparent plate

โœ Scribed by Zhi-Cheng Jian; Cheng-Chih Hsu; Der-Chin Su

Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
97 KB
Volume
226
Category
Article
ISSN
0030-4018

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โœฆ Synopsis

The phase difference between s-and p-polarizations of a circularly polarized heterodyne light beam reflected from a transparent plate is measured. The measured data is substituted into the specially derived equations and the refractive index can be calculated. Next, the variations of phase difference between s-and p-polarizations due to the wavelength shift and the extraction of the plate in a modified Michelson interferometer are measured. Then, its thickness can be calculated based on the measured value of refractive index, the variations of phase difference, and the specified value of wavelength shift.

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This study develops a non-destructive measurement system based on a position sensing detector (PSD) and a laser interferometer for determining the thickness and refractive indices of a birefringent optical wave plate. The proposed metrology system provides the ability to measure the refractive index