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Determination of the Thickness and Refractive Index of Cu2O Thin Film Using Thermal and Optical Interferometry

✍ Scribed by Abu-Zeid, M. E. ;Rakhshani, A. E. ;Al-Jassar, A. A. ;Youssef, Y. A.

Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
466 KB
Volume
93
Category
Article
ISSN
0031-8965

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Determination of the refractive index and the thickness of thin-films using light interference have been presented. This has been done, for the first time, with the use of LloydΓ•s interferometer. The mean idea is based on using the sample in two different positions in the same interferometer. The me