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Direct Monitoring of Thickness and Refractive Index of Optical Thin Film Deposited on Fiber End-face

✍ Scribed by Yoshio Suzuki; Shinji Nagaoka; Yuji Uenishi


Publisher
Optical Society of Japan
Year
1999
Tongue
English
Weight
523 KB
Volume
6
Category
Article
ISSN
1340-6000

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Pressure dependence of thickness and ref
✍ Gerd Kleideiter; Manfred Dieter Lechner; Wolfgang Knoll πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 93 KB πŸ‘ 2 views

Total internal reflection (TIR) and attenuated total reflection (ATR) measurements in the Kretschmann configuration have been performed at 25 8C with poly(methyl methacrylate) (PMMA) films (of ca. 2.5 lm thickness) spincoated on top of a 50 nm thick gold layer, as a function of the applied hydrostat