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Ultraviolet induced defect creation and annihilation in low-temperature-deposited SiO2

✍ Scribed by Devine, R. A. B.; Francou, J-M.

Book ID: 120624949
Publisher: American Institute of Physics
Year: 1989
Tongue: English
Weight: 622 KB
Volume: 66
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.343629

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