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Tunneling and thermal emission of electrons from a distribution of deep traps in SiO2 [nMOSFET]

✍ Scribed by Hwang, N.; Or, B.S.S.; Forbes, L.


Book ID
114535138
Publisher
IEEE
Year
1993
Tongue
English
Weight
390 KB
Volume
40
Category
Article
ISSN
0018-9383

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