Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO2/metal structures

✍ Scribed by V. Filip; Hei Wong; D. Nicolaescu

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 219 KB
• Volume: 46
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2005.10.014