Comparison of X-ray-induced electron and hole trapping in various materials (YSZ, SIMOX, thermal SiO2)

✍ Scribed by P. Paillet; P. Gonon; C. Schwebel; J.-L. Leray

• Book ID: 115990355
• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 338 KB
• Volume: 187
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/0022-3093(95)00132-8