✦ LIBER ✦

Tunnel and Sehottky Current in Dielectric Thin Films Considering Film Thickness Fluctuations

✍ Scribed by J. Antula

Publisher: John Wiley and Sons
Year: 1967
Tongue: English
Weight: 254 KB
Volume: 24
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.19670240108

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

4.16 Effect of non-uniform thickness of

4.16 Effect of non-uniform thickness of thin dielectric films on capacitance and tunner currents

✍ Z Hurych 📂 Article 📅 1967 🏛 Elsevier Science 🌐 English ⚖ 171 KB

An explanation of the asymmetry in elect

An explanation of the asymmetry in electron and hole tunnel currents through ultra-thin SiO2 films

✍ A.G. O'Neill 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 518 KB

Semi-empirical and practical model for l

Semi-empirical and practical model for low-electric field direct tunneling current estimation in nanometer-thick SiO2films

✍ Hiroshi Nakatsuji; Akira Shimizu; Yasuhisa Omura 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 130 KB

This paper describes a simplified model of the direct tunneling current characteristics of thin SiO 2 films. The theoretical direct tunneling current calculations take into account the dark space at the Si/SiO 2 interface in a simple manner. Theoretical curves comparatively well reproduce experiment

Independent interface and bulk film cont

Independent interface and bulk film contributions to reduction of tunneling currents in stacked oxide/nitride gate dielectrics with monolayer nitrided interfaces

✍ G Lucovsky; H Niimi; Y Wu; H Yang 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 667 KB

Current-voltage characteristics, dielect

Current-voltage characteristics, dielectric breakdown and potential distribution measurements in Au-SiOx-Au thin film diodes and triodes : R. D. Gould and C. A. Hogarth. Int. J. Electron., 1974. Vol. 37. No. 2. p. 157

📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 131 KB

964. A method for measurement of thickne

964. A method for measurement of thickness of thin dielectric films during the process of their evaporation in vacuum: V I Matveev and Yu V Salnikov, Rep of Moscow Bauman High Tech School, No 155, 1973, 103–106 (in Russian)

📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 145 KB