Tungsten metallization technology for high temperature silicon-on-insulator devices
β Scribed by Jian Chen; J.-P. Colinge
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 229 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0921-5107
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π SIMILAR VOLUMES
The motivation to develop high-temperature resistant smart-power products and the impact of silicon-on-insulator (SOI) technology are discussed. The electrical and thermal behaviour of devices on SOI-substrates is illustrated, with examples, showing that smart-power integrated circuits can be design
Catalytic metal gate-silicon dioxide-silicon carbide (MOSiC) capacitors operating to about 800 "C are used as high temperature gas sensor devices. Hydrogen or hydrogen containing molecules, which are dissociated on the catalytic metal surface, create a decrease of the flat band voltage of the MOS ca