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Trapezoid defect in 4H–SiC epilayers

✍ Scribed by R.A. Berechman; S. Chung; G. Chung; E. Sanchez; N.A. Mahadik; R.E. Stahlbush; M. Skowronski

Book ID: 116630060
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 386 KB
Volume: 338
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2011.10.009

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