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Trap density characterization through low-frequency noise in junctionless transistors

✍ Scribed by Doria, Rodrigo Trevisoli; Trevisoli, Renan Doria; de Souza, Michelly; Pavanello, Marcelo Antonio


Book ID
123460369
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
1020 KB
Volume
109
Category
Article
ISSN
0167-9317

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