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Direct measurements of trap density in a SiGe/Si hetero-interface and correlation between the trap density and low-frequency noise in SiGe-channel pMOSFETs
✍ Scribed by Tsuchiya, T.; Imada, Y.; Murota, J.
- Book ID
- 114617257
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 388 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0018-9383
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