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Characterization of Channel-Diameter-Dependent Low-Frequency Noise in Silicon Nanowire Field-Effect Transistors

✍ Scribed by Lee, Sang-Hyun; Baek, Chang-Ki; Park, Sooyoung; Kim, Dong-Won; Sohn, Dong Kyun; Lee, Jeong-Soo; Kim, Dae M.; Jeong, Yoon-Ha

No coin nor oath required. For personal study only.

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