A novel cross-sectional sample preparation technique for quantum wire (QWR) structures is described. By coating a thin layer of Au with a designed pattern on the sample as a marker to indicate the position of the wire pattern, the location of the thinned area can be controlled precisely. An example
Transmission electron microscopy characterization of hard coatings and films: sample preparation aspects and results
✍ Scribed by G. Radnóczi; Á. Barna
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 996 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0257-8972
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
TEM sample preparation, VLSI, semiconductor processing, Defect analysis A cross-sectional sample preparation technique is described that relies on lithographic and dry-etching processing, thus avoiding metallographic polishing and ion milling. The method is capable of producing cross-sectional trans
Common methods for the preparation of cultured cells for concurrent light microscopy (LM), scanning electron microscopy (SEM), and transmission electron microscopy (TEM) are not completely satisfactory. This article describes how we grow mammalian cells on plastic disks made from Aclar film. Aclar i