✦ LIBER ✦
Nodular growth in thin films: Preparation and transmission electron microscopy characterization in CoCr layers on silicon substrates
✍ Scribed by R. Mattheis; F. Thrum; H.-J. Anklam
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 472 KB
- Volume
- 188
- Category
- Article
- ISSN
- 0040-6090
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