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Transconductance Technique for Measurement of Interface State Density and Oxide Charge in LDD-MOSFET's

✍ Scribed by Das, N. C. ;Duggan, P. W. C. ;Nathan, V.

Publisher: John Wiley and Sons
Year: 1992
Tongue: English
Weight: 584 KB
Volume: 133
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211330118

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