Trace Analysis || Organics at Surfaces, their Detection and Analysis by Static Secondary Ion Mass Spectrometry [and Discussion]
β Scribed by A. J. Paul, J. C. Vickerman, M. Grasserbauer, K. E. Cooksey, R. F. C. Mantoura, B. Evans and W. J. Albery
- Book ID
- 123660772
- Publisher
- The Royal Society
- Year
- 1990
- Tongue
- English
- Weight
- 327 KB
- Volume
- 333
- Category
- Article
- ISSN
- 0264-3952
- DOI
- 10.2307/76781
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
## Abstract For the analysis of hydrogen and helium in solids and thin films by secondary ion mass spectrometry, the use of Cs^+^ primary ions in conjunction with the detection of HCs^+^ and HeCs^+^ molecular ions is proposed. For both species, detection limits of the order of 10^19^ atoms cm^β3^ a
## Abstract SIMS relative sensitivity factors and detection limits are reported for seventeen elements in epitaxiallyβgrown ZnSe on GaAs, using oxygen and cesium primary ion beams. Analytical considerations necessary for obtaining the lowest detection limits are discussed.