✦ LIBER ✦

Elemental depth profiling of a-Si1−xGex:H films by elastic recoil detection analysis and secondary ion mass spectrometry

✍ Scribed by A. Mikami; T. Takagawa; K. Nishio; H. Ogawa; T. Okazawa; Y. Kido

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 417 KB
Volume: 252
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2005.07.023

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of ion-beam- and magnet

Characterization of ion-beam- and magnetron- sputtered YBa2Cu3O7−x high Tc superconducting films by secondary neutral mass spectrometry depth profiling

✍ C. Mössner; K.-D. Ufert; P. Köpfer; V. Rupertus; H. Oechsner 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 410 KB

Quantitative analysis of binary adsorbed

Quantitative analysis of binary adsorbed protein films by time of flight secondary ion mass spectrometry

✍ Wagner, M. S. ;Shen, M. ;Horbett, T. A. ;Castner, David G. 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 150 KB

## Abstract Time of flight secondary ion mass spectrometry (ToF‐SIMS) is an ideal technique for the analysis of adsorbed protein films because of its surface sensitivity and chemical specificity. In this study, we examined ToF‐SIMS with the multivariate calibration method partial least squares regr

Quantitative analysis and depth profilin

Quantitative analysis and depth profiling of rare gases in solids by secondary-ion mass spectrometry : detection of (CsR)+ molecular ions (R = rare gas): M A Ray et al, J Vac Sci Technol, A6, 1988, 44–50

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 157 KB