𝔖 Bobbio Scriptorium
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Quantitative analysis and depth profiling of rare gases in solids by secondary-ion mass spectrometry : detection of (CsR)+ molecular ions (R = rare gas): M A Ray et al, J Vac Sci Technol, A6, 1988, 44–50


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
157 KB
Volume
39
Category
Article
ISSN
0042-207X

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