Characterization of ion-beam- and magnetron- sputtered YBa2Cu3O7−x high Tc superconducting films by secondary neutral mass spectrometry depth profiling

✍ Scribed by C. Mössner; K.-D. Ufert; P. Köpfer; V. Rupertus; H. Oechsner

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 410 KB
• Volume: 174
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(89)90899-7