𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Total reflection X-ray spectrometry

✍ Scribed by Donald E. Leyden


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
289 KB
Volume
4
Category
Article
ISSN
0165-9936

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Optimization of curved x-ray multilayer
✍ Krassimir Stoev; Joachim Knoth; Heinrich Schwenke πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 408 KB πŸ‘ 2 views

Various x-ray optical conΓΌgurations combining focusing and monochromatizing mirrors for application in total reΓ½ection x-ray Γ½uorescence (TXRF) spectrometry were numerically modelled for the case of extended x-ray sources. The inΓ½uence of the system parameters, such as mirror shape, the extension of

Total reflection X-ray photoelectron spe
✍ Jun Kawai; Shinjiro Hayakawa; Yoshinori Kitajima; Kuniko Maeda; Yohichi Gohshi πŸ“‚ Article πŸ“… 1995 πŸ› Elsevier Science 🌐 English βš– 341 KB
Total reflection X-ray fluorescence spec
✍ U. Weisbrod; R. Gutschke; J. Knoth; H. Schwenke πŸ“‚ Article πŸ“… 1991 πŸ› Springer 🌐 English βš– 622 KB

Measurements of X-ray fluorescence spectra versus grazing incident angles provide information on elemental composition as well as density and thickness of near surface layers. Calculations of fluorescence intensities are presented, which are used for the evaluation of data obtained by total reflecti

Surface analysis by total-reflection X-r
✍ HΓ©ctor J. Sanchez; Carlos A. Perez; Roberto D. Perez; Marcelo Rubio πŸ“‚ Article πŸ“… 1996 πŸ› Elsevier Science 🌐 English βš– 523 KB

Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental

Microanalytical Investigation of Xylem S
✍ Gy. ZΓ‘ray; A. Varga; F. Fodor; E. Cseh πŸ“‚ Article πŸ“… 1997 πŸ› Elsevier Science 🌐 English βš– 97 KB

Concentrations of essential elements (K, Ca, Cu, Fe, Mn, Zn) and toxic lead in xylem fluid of cucumber plants growing in lead-free and lead-contaminated nutrient solutions were determined by total reflection X-ray fluorescence spectrometry. Amounts of essential elements transported in xylem during t