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Total reflection X-ray photoelectron spectroscopy of copper phthalocyanine–gold multilayers

✍ Scribed by Jun Kawai; Hiroyuki Amano; Kouichi Hayashi; Toshihisa Horiuchi; Kazumi Matsushige; Yoshinori Kitajima

Book ID
114254476
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
532 KB
Volume
52
Category
Article
ISSN
0584-8547

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## X-ray photoelectron spectra of two Ta-Ti bilayers on a Si wafer are measured using a soft x-ray synchrotron radiation beamline at the Photon Factory. The grazing incident x-rays are used to excite photoelectrons. The photoelectron intensity dependence is measured as the change in the glancing an