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Total-reflection x-ray microscopy

✍ Scribed by Jibaoui, H.; Erre, D.; Cazaux, J.


Book ID
121525108
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
742 KB
Volume
72
Category
Article
ISSN
0034-6748

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Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental