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Total-reflection X-ray fluorescence analysis using special X-ray sources

✍ Scribed by P. Wobrauschek; P. Kregsamer; W. Ladisich; R. Rieder; C. Streli

Book ID: 113374867
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 637 KB
Volume: 48
Category: Article
ISSN: 0584-8547
DOI: 10.1016/0584-8547(93)80018-p

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