✦ LIBER ✦

Total reflection PIXE: a very sensitive technique for surface analysis

✍ Scribed by R.D. Vis; F. van Langevelde

Book ID: 113281646
Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 562 KB
Volume: 61
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(91)95331-7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Total reflection PIXE (TPIXE) and RBS fo

Total reflection PIXE (TPIXE) and RBS for surface and trace element analysis

✍ J.A. van Kan; R.D. Vis 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 717 KB

Glancing incident MeV ion beams for tota

Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysis

✍ J.A. van Kan; R.D. Vis 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 473 KB

FT-IR in Combination with the Attenuated

FT-IR in Combination with the Attenuated Total Reflectance Technique: A Very Sensitive Method for the Structural Analysis of Polypeptides

✍ Singh, Bal Ram; Fuller, Michael P. 📂 Article 📅 1991 🏛 Society for Applied Spectroscopy 🌐 English ⚖ 444 KB

A numerical technique for Total Site sen

A numerical technique for Total Site sensitivity analysis

✍ Peng Yen Liew; Sharifah Rafidah Wan Alwi; Petar Sabev Varbanov; Zainuddin Abdul 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 653 KB

Total reflection X-ray fluorescence: A t

Total reflection X-ray fluorescence: A technique for trace element analysis in materials

✍ N.L. Misra; K.D. Singh Mudher 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 614 KB

## Total Reflection X-ray Fluorescence (TXRF) is a variant of Energy dispersive X-ray Fluorescence (EDXRF). It is a comparatively new method of trace element analysis and finds its application in various research areas of material development and processing. The versatility of TXRF is due to (i.) r

Mathematical model for evaluation of sur

Mathematical model for evaluation of surface analysis data by total reflection XRF

✍ Roberto D. Pérez; Héctor J. Sánchez; Marcelo Rubio; Carlos A. Pérez 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 90 KB 👁 1 views

The general problem of an electromagnetic wave moving through a stratified medium appears naturally in all the techniques associated with surface analysis by total reflection. It is a consequence of the theoretical models that describe that describe the physical processes involved in these technique