✦ LIBER ✦

Total reflection PIXE (TPIXE) and RBS for surface and trace element analysis

✍ Scribed by J.A. van Kan; R.D. Vis

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Glancing incident MeV ion beams for tota

✍ J.A. van Kan; R.D. Vis 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 473 KB

An ERD/RBS/PIXE apparatus for surface an

✍ C. Janicki; P.F. Hinrichsen; S.C. Gujrathi; J. Brebner; J.-P. Martin 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 1009 KB

Applications of total reflection X-ray f

✍ H. Schwenke; P. A. Beaven; J. Knoth 📂 Article 📅 1999 🏛 Springer 🌐 English ⚖ 342 KB

Application of FTIR, PIXE, and EBS for t

✍ W.M. Kwiatek; J. Lekki; C. Paluszkiewicz; N. Preikschas 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 420 KB

Quantitative Analysis of Minor and Trace

✍ von Bohlen, Alex 📂 Article 📅 2004 🏛 Taylor and Francis Group 🌐 English ⚖ 164 KB

Determination of trace element distribut

✍ D. von Czarnowski; E. Denkhaus; K. Lemke 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 358 KB