Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysis

✍ Scribed by J.A. van Kan; R.D. Vis

• Book ID: 113287372
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 473 KB
• Volume: 113
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/0168-583x(95)01355-5