✦ LIBER ✦

Total ionizing dose reliability of thin SiO2 in PowerMOSFET devices

✍ Scribed by A. Cascio; G. Currò; A. Cavagnoli

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Pre-breakdown noise in electrically stre

✍ M. Porti; S. Meli; M. Nafrı́a; X. Aymerich 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 160 KB

ChemInform Abstract: Preparation of Devi

✍ G. LUCOVSKY 📂 Article 📅 2010 🏛 John Wiley and Sons ⚖ 29 KB

Effect of ion energy and dose on the pos

✍ M. Carrada; C. Bonafos; G. Ben Assayag; D. Chassaing; P. Normand; D. Tsoukalas; 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 514 KB

Dependence of trap density in SiO2 thin

📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 168 KB