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Total external X-ray reflection: A novel method of surface chemical analysis

✍ Scribed by Cocks, Franklin H.; Gettliffe, Roland

Book ID
121976575
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
321 KB
Volume
3
Category
Article
ISSN
0167-577X

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Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental