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Chemical Analysis of Used Three-Way Catalysts by Total Reflection X-ray Fluorescence

✍ Scribed by Fernández-Ruiz, R.; Furió, M.; Galisteo, F. Cabello; Larese, C.; López Granados, M.; Mariscal, R.; Fierro, J. L. G.

Book ID
126028564
Publisher
American Chemical Society
Year
2002
Tongue
English
Weight
158 KB
Volume
74
Category
Article
ISSN
0003-2700

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Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental