Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental
Total reflection X-ray fluorescence analysis with chemical microchip
β Scribed by Kouichi Tsuji; Yousuke Hanaoka; Akihide Hibara; Manabu Tokeshi; Takehiko Kitamori
- Book ID
- 108261587
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 225 KB
- Volume
- 61
- Category
- Article
- ISSN
- 0584-8547
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