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Total dose radiation hardness of MOS devices in hermetic ceramic packages

✍ Scribed by Kohler, R.A.; Kushner, R.A.; Kuo Hua Lee

Book ID: 114554625
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 543 KB
Volume: 35
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.25486

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