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[IEEE 2011 Spanish Conference on Electron Devices (CDE) - Palma de Mallorca, Spain (2011.02.8-2011.02.11)] Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011 - Simulation of Total Ionising Dose in MOS capacitors

✍ Scribed by Fernandez-Martinez, P.; Cortes, I.; Hidalgo, S.; Flores, D.; Palomo, F. R.

Book ID: 124103421
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 215 KB
Category: Article
ISBN: 1424478634
DOI: 10.1109/SCED.2011.5744251

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