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[IEEE 2011 Spanish Conference on Electron Devices (CDE) - Palma de Mallorca, Spain (2011.02.8-2011.02.11)] Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011 - GaN Ohmic contact resistance vs temperature

✍ Scribed by Fontsere, A.; Perez-Tomas, A.; Placidi, M.; Fernandez-Martinez, P.; Baron, N.; Chenot, S.; Cordier, Y.; Moreno, J. C.; Jennings, M. R.; Gammon, P. M.; Walker, D.

Book ID: 115484269
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 188 KB
Volume: 0
Category: Article
ISBN: 1424478634
DOI: 10.1109/sced.2011.5744188

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