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Total-Dose and Dose-Rate Dependence of Proton Damage in MOS Devices during and after Irradiation

✍ Scribed by Stassinopoulos, E. G.; Brucker, G. J.; Van Gunten, O.


Book ID
114663080
Publisher
IEEE
Year
1984
Tongue
English
Weight
958 KB
Volume
31
Category
Article
ISSN
0018-9499

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