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Recovery of Damage in Rad-Hard MOS Devices during and after Irradiation by Electrons, Protons, Alphas, and Gamma Rays

โœ Scribed by Brucker, G. J.; Van Gunten, O.; Stassinopoulos, E. G.; Shapiro, P.; August, L. S.; Jordan, T. M.


Book ID
114662867
Publisher
IEEE
Year
1983
Tongue
English
Weight
875 KB
Volume
30
Category
Article
ISSN
0018-9499

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