✦ LIBER ✦
MOS device degradation due to total dose ionizing radiation in the natural space environment: A review
✍ Scribed by K.F. Galloway; R.D. Schrimpf
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 791 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0026-2692
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