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Total-Dose and Charge-Trapping Effects in Gate Oxides for CMOS LSI Devices

✍ Scribed by Singh, Rama S.; Korman, Charles S.; Kaputa, Douglas J.; Surowiec, Edward P.

Book ID: 114663087
Publisher: IEEE
Year: 1984
Tongue: English
Weight: 869 KB
Volume: 31
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1984.4333541

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