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Topological Analysis of Defects in Epitaxial Nitride Films and Interfaces

✍ Scribed by G.P. Dimitrakopulos; Ph. Komninou; R.C. Pond

Publisher: John Wiley and Sons
Year: 2001
Tongue: English
Weight: 781 KB
Volume: 227
Category: Article
ISSN: 0370-1972
DOI: 10.1002/1521-3951(200109)227:1<45::aid-pssb45>3.0.co;2-w

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