✦ LIBER ✦
Interface Controlled Materials (RUEHLE:INTERFACE CONT.MAT O-BK) || Structure and Ordering Process in Epitaxial Ultra-Thin Films of Metallic Alloys: In-Situ Temperature X-ray Diffraction of AuNi Layers
✍ Scribed by Rühle, M.; Gleiter, H.
- Publisher
- Wiley-VCH Verlag GmbH & Co. KGaA
- Year
- 2005
- Weight
- 158 KB
- Category
- Article
- ISBN
- 352760622X
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