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TOF-SIMS and XPS-investigations of ion implanted single crystal 1b-diamonds

✍ Scribed by V. Schlett; T. Fladung; S. Dieckhoff; R. Stock

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

ToF–SIMS and XPS study of ion implanted

✍ A. Franquet; D. Tsvetanova; T. Conard; R. Vos; G. Vereecke; P.W. Mertens; M.M. H 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 469 KB

Deposition of intact tetrairon(iii) sing

✍ Pineider, Francesco ;Mannini, Matteo ;Danieli, Chiara ;Armelao, Lidia ;Piras, Fe 📂 Article 📅 2010 🏛 Royal Society of Chemistry 🌐 English ⚖ 539 KB

Investigation of H+ and B+/H+ implantati

✍ Qing Wan; Lianwei Wang; Weili Liu; Miao Zhang; Chenglu Lin 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 442 KB

Comparison of implantation and diffusion

✍ J. Lee; J. Metson; P.J. Evans; U. Pal; D. Bhattacharyya 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 741 KB

XPS studies on damage evaluation of sing

✍ Kawabata, Yusaku; Taniguchi, Jun; Miyamoto, Iwao 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 198 KB

Crystallinity of freestanding large undo

✍ Tsubouchi, Nobuteru; Mokuno, Y.; Chayahara, A.; Shikata, S. 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 613 KB