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Time-dependent dielectric breakdown of 210 Å oxides : K. C. Boyko and D. L. Gerlach. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 1 (1989)

Book ID: 103284870
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 244 KB
Volume: 30
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(90)90446-t

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