Interface degradation and dielectric breakdown of thin oxides due to homogeneous charge injection : M. Kerber and U. Schwalke. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 17 (1989)

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 128 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90525-r