𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Time-dependent-dielectric-breakdown characteristics of Hf-doped Ta2O5/SiO2 stack

✍ Scribed by Atanassova, E.; Novkovski, N.; Spassov, D.; Paskaleva, A.; Skeparovski, A.


Book ID
121922583
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
840 KB
Volume
54
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES