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Dielectric breakdown properties of Ta2O5SiO2 stacked thin films prepared by r.f. sputtering

โœ Scribed by Ken-ichi Onisawa; Yoshio Abe; Takahiro Nakayama; Moriaki Fuyama; Yoshimasa A. Ono


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
336 KB
Volume
221
Category
Article
ISSN
0040-6090

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