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Time-dependent dielectric breakdown of SiO2 films in a wide electric field range

โœ Scribed by A Teramoto; H Umeda; K Azamawari; K Kobayashi; K Shiga; J Komori; Y Ohno; A Shigetomi


Book ID
108361765
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
333 KB
Volume
41
Category
Article
ISSN
0026-2714

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