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Threshold-voltage temperature drift in ion-implanted MOS transistors

✍ Scribed by Bang-Sup Song; Gray, P.R.

Book ID: 114594071
Publisher: IEEE
Year: 1982
Tongue: English
Weight: 771 KB
Volume: 29
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1982.20759

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